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Surface contamination of optical elements studied by Low Energy Ion Scattering LEIS
Sekula, Filip ; Kolíbal, Miroslav (referee) ; Průša, Stanislav (advisor)
This thesis focuses on study of surface contamination of optical elements using the low energy ion scattering method, LEIS. Presence of surface contaminations on optical elements has a negative contribution on thin layers that are applied upon them. The contamination can occur between the steps of manufacturing process. By determining the composition of the contaminations it could be possible to increase effectiveness during the growth of thin layers. Measurement is realised on right angle prisms at room temperature. We also focus on construction of sample holder that would allow heating of samples in the preparation chamber. Later we measure reference spectra for quantification of surface contamination.
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Surface contamination of optical elements studied by Low Energy Ion Scattering LEIS
Sekula, Filip ; Kolíbal, Miroslav (referee) ; Průša, Stanislav (advisor)
This thesis focuses on study of surface contamination of optical elements using the low energy ion scattering method, LEIS. Presence of surface contaminations on optical elements has a negative contribution on thin layers that are applied upon them. The contamination can occur between the steps of manufacturing process. By determining the composition of the contaminations it could be possible to increase effectiveness during the growth of thin layers. Measurement is realised on right angle prisms at room temperature. We also focus on construction of sample holder that would allow heating of samples in the preparation chamber. Later we measure reference spectra for quantification of surface contamination.
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Basic Optical Elements 2D Raytracing
Danczi, Dávid ; Havel, Jiří (referee) ; Seeman, Michal (advisor)
This bachelor's thesis describes analysis, design and implementation of an application, which simulates the method of ray tracing through simple optical elements. Further it examines the issue of computer graphics and description of the Windows API programming interface.
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Misalignment aberrations
Dvořák, David
Misalignment aberrations arise from (small) imperfections of lens geometry - either because of the inaccuracy in the manufacturing of individual elements (like electrodes and/or pole-piece defects) or the misalignment of the optical elements in the system (tilted of shifted element). Under suchcircumstances the ideal symmetry is disturbed and additional parasitic fields are produced. In the effect they are producing additional image aberrations.
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